Agilent 41501B SMU and Pulse Generator Unit – 500kHz dual pulse generators for pulse voltage stressing and charge pumping measurements
Agilent 16440A SMU/Pulse Generator Selector
Agilent E5250A Low Leakage Switch Matrix
Agilent 81110A Pulse/Pattern Generator Unit
HP 4284A LCR meter
Metrics Technology Interactive Characterization Software (Controls 4156C system for automation!)
Agilent E3662B Rack Cabinet – Modularizes the Agilent Characterization System
Custom built aluminum Faraday cage with shielded probe feed-throughs
Keithly Characterization Systems
2-Keithley 4200 Semiconductor Characterization System – 4 source measurement units and 4 pre-amps with 0.1 femtoampere current resolution. One 4200 has the PIV-A, PIV-Q, and C-V options
Keithley 595 Quasistatic CV Meter
2 HP 4284A LCR meter
2 Keithley 707A Ultra Low Current-High Frequency Solid State Switching matrix (3-8X24 I/O cards)
Variable Temperature Probe Station
Janis Research Probe Station
Edwards EXT 70H Compound Molecular Pump
Edwards E2M1.5 Rotary Vacuum Pump
Edwards EXDC80 Turbomolecular Pump
Lakeshore 340 Temperature Controller
Low Noise Spectroscopy Station
1 DC Battery Powered Source
1 Yokogawa 765101-A-3/D Programmable DC Voltage/Current Source with Front Output Terminal and GPIB, 115/100 V AC, UL Standard
1 Hewlett Packard 34401A Multimeter
1 Pomona Shielded Housing for 100 K Resistors
1 Stanford Research SR560 Low Noise Preamplifier
1 Hewlett Packard (HP) 35665A Dynamic Signal Analyzer (DSA)