Graduate Research Assistant
Contact Information
Email: steveletourneau@u.boisestate.edu
Ph: (208) 991-4303
LinkedIn
Instruments and Techniques
Characterization
- Electron Microscopy: TEM, SEM, SADP, STEM
- X-Ray Diffraction: Powder diffraction, XRR
- Scanning Probe: AFM, STM
Processing
- Atomic Layer Deposition
- Chemical Layer Deposition
- Solid State Ceramic Processing
- Sol-Gel Processing
Selected Peer Reviewed Journal Publications
A. U. Mane, S. Letourneau, D. J. Mandia, J. Liu, J. A. Libera, Y. Lei, Q. Peng, E. Graugnard, and J. W. Elam, “Atomic layer deposition of molybdenum disulfide films using MoF6 and H2S,” J. Vac. Sci. Technol. A, vol. 36, no. 1, p. 01A125, 2018.
S. Letourneau, Z. Zhen, J. Owens, K. Tolman, R. Ubic, and W. M. Kriven, “Lattice constant prediction of defective rare earth titanate perovskites,” Journal of Solid State Chemistry, vol. 219, pp. 99-107, 11/2014 2014.
R. Ubic, K. Tolman, K. Chan, N. Lundy, S. Letourneau, and W. M. Kriven, “Effective Size of Vacancies in Aliovalently Doped SrTiO3 Perovskites,” Journal of Alloys and Compounds, vol. 575, pp. 239-245, 2013.
R. Ubic, S. Letourneau, S. Thomas, G. Subodh, and M. T. Sebastian, “Structure, microstructure, and microwave dielectric properties of (Sr2-xCax)(MgTe)O6 double perovskites,” Chemistry of Materials, vol. 22, pp. 4572-4578, 2010.
Conference Presentations and Posters
Lattice constant prediction in defective microwave dielectric resonators. Oral presentation at Department of Materials Science and Engineering Hard Seminar Series, Urbana, IL, November 14, 2013.
Role of point defects in microwave dielectric resonators. Oral presentation at 10th Pacific Rim Conference on Ceramic and Glass Technology, San Diego, CA, June 4, 2013.