The journal IEEE Transactions on Device and Materials Reliability listed their top ten accessed articles for September 2010. One of the articles listed a 2010 article by our own Ricki Southwick, Justin Reed, Chris Buu, and Ross Butler with research advisor Bill Knowlton and with Dr. Gennadi Bersuker of SEMATECH. The article is titled “Limitations of Poole-Frenkel Conduction in Bilayer HfO2/SiO2 MOS Devices, IEEE Transactions on Device and Materials Reliability.”