Boise State Center for Materials Characterization
Lab Location
Boise State University, Boise, Idaho
Expertise & Research
Materials characterization of non-organic materials at the micro, nano and atomic scale
Staff
Dr. Karthik Chinnathambi
TEM/XRD Research Engineer & Lab Manager
karthikchinnathambi@boisestate.edu
(208) 426-4646
| Asset | Mfr and Model | Field | Application |
|---|---|---|---|
| Transmission electron microscope (TEM) | JEOL JEM-2100 HR with EDS, EELS, ASTAR and Gatan heating/cooling holders. | Materials Characterization | Microstructural, structural and chemical analysis of materials at atomic level. |
| Electron Microprobe Microanalzyer (EPMA) | CAMECA SXFive | Materials Characterization | Light element mapping, interdiffusion in metals and alloys. X-ray mapping and quantitative analysis of trace element s in minerals. -Provide microstructure and geochronology data. |
| Field Emission Scanning Electron Microscope (FESEM) | FEI Teneo | Materials Characterization | Elemental mapping and analysis. |
| Scanning Electron Microscope (SEM) | Hitachi S-3400N with EDS | Materials Characterization | Resolution to 3-4 nm. Can deterrmine elemental composition of samples with EDS module. |
| Benchtop X-ray Diffraction (XRD) System | Rigaku MiniFlex 600 with high-speed D/teX detector | Materials Characterization | Rapid phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and crystal structure. |
| X-ray diffraction (XRD) system | Bruker AXS D8 Discover with point and HISTAR area detectors. | Materials Characterization | Phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and crystal structure powders/single crystals. Thickness, composition, texture and strain analysis of thinfilms/epitaxial layers. Phase transformation studies via in situ cooling/heating. |
| Hand-held X-ray flourescent (XRF) analyzer | Bruker Tracer III SD | Materials Characterization | Handheld device- non-destructive elemental identification and quantification of most elements from magnesium to uranium. |
| TEM Ion Slicer | JEOL EM-09100IS | Materials Characterization | Prepares an ultra thin TEM section of a larger material specimen. |
| Grinding wheels | Struers LaboPol-5, Qty 2 | Materials Characterization | Grinding and polishing of samples for microstructural studies using optical, SEM and TEM. |
| Dimple Grinder | Gatan Model 656 | Materials Characterization | TEM sample preparation. |
| Precision ion polishing system (PIPS) | Gatan 691 with camera | Materials Characterization | Ion thinning of metals and ceramics for TEM imaging. |
| Glass knife maker (GKM) | Boeckeler Instruments, GKM | Materials Characterization | Fabricate glass knives for the microtome. |
| Inverted Optical Microscope | Buehler Versamet 3 | Materials Characterization | Quick viewing and imaging of specimens in brightfield, darkfield, polarized light and differential interference contrast. |
| Ultramicrotome | Lecia EM UC6, Qty 2 | Materials Characterization | Room temperature TEM sample preparation of soft inorganic and organic materials. |
| Carbon Evaporator | Emitech K950X | Materials Characterization | Deposit conductive carbon film for SEM analysis. |
| Optical Microscope | Leica DM6000 M | Materials Characterization | High magnification optical microscope with brightfield, dark field and DIC modes to study the surface topography and microstructre of materials. Large area and 3D imaging using power automated mosaic and Z-stacking modules. Surface geometry and texture analysis. |
| Electropolisher | Fischione Model 110 | Materials Characterization | Electronpolishing of metals for TEM imaging. |
| Electropolisher | Struers, Tenupol-3 | Materials Characterization | Electronpolishing of metals for TEM imaging. |
| Rotary Disc cutter | Southbay 360 | Materials Characterization | Cut cylinders/discs of various diameters for TEM. |
| Disc punch | Gatan 659 | Materials Characterization | Punch out 3 mm metal disc samples for TEM. |
| Ion Beam Thinner | Gatan Model 691 PIPS | Materials Characterization | Sample preparation for TEM. |
| Ultrasonic Disk Grinder | South Bay Technology SonicCut 380 | Materials Characterization | Sample preparation for TEM. |