Location
Center for Advanced Energy Studies (CAES)
Idaho Falls, Idaho
Lab Director
Dr. Yaqiao Wu
(208) 533-8112
yaqiaowu@boisestate.edu
Expertise and Research
MaCS has the capabilities to characterize a wide range of materials, including metals, semiconductors, ceramics, coal and minerals in bulk or powder forms, as well as some organic cellular materials. It can provide 2-D/3-D morphology, chemical information, and mechanical testing data from micron to atomic scale.
Scheduling and Contracting Work
Please contact the lab director to discuss work you would like done in this lab.
MaCS + AML Equipment Table
Use the search field to search for and filter content in this table.| Asset | Mfr and Model | Field | Application | Lab Name |
|---|---|---|---|---|
| Scanning Transmission Electron Microscope (STEM) | FEI Tecnai TF30-FEG STwin TEM with EDS, EELS (GIF), EFTEM & TopSpin | Materials characterization | Images materials structurally and chemically down to atomic scale | Microscopy and Characterization Suite (MaCS) |
| Local Electrode Atom Probe (LEAP) | Cameca LEAP 4000X HR | Materials characterization | Creates atomic mapping / imaging | Microscopy and Characterization Suite (MaCS) |
| Dual Beam Focused Ion Beam Microscope (FIB) – Scanning Electron Microscope (SEM) | FEI QUANTA 3D FEG with EDS & EBSD | Materials characterization | 2-D and 3-D materials characterization and analysis | Microscopy and Characterization Suite (MaCS) |
| Scanning Electron Microscope (SEM) | JEOL JSM 6610LV with EDS, EBSD, & CL | Materials characterization | Images material surfaces from micrometer to nanometer scale | Microscopy and Characterization Suite (MaCS) |
| Nano Indenter Atomic Force Microscope | Hysitron TI950 TriboIndenter | Materials characterization | Nano-mechanical test instrument for measuring the hardness and elastic modulus of materials, and imaging surface morphology down to atomic scale | Microscopy and Characterization Suite (MaCS) |
| X-Ray Diffractometer (XRD) | Rigaku SmartLab | Materials characterization | Phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. | Microscopy and Characterization Suite (MaCS) |
| Nanomill | Fishione 1040 | Materials characterization | TEM sample preparation | Microscopy and Characterization Suite (MaCS) |
| Ion Mill, Precision Ion Polishing System (PIPS) | Gatan PIPS II | Materials characterization | Sample preparation | Microscopy and Characterization Suite (MaCS) |
| Electrolyte Polisher | Fishione | Materials characterization | Sample preparation | Microscopy and Characterization Suite (MaCS) |
| Spark Plasma Sintering System (SPS) | Fuji Dr. Sinter | Materials characterization | Isostatic sintering of metallic or ceramic powders at very high (2000C) temperatures. | Advanced Materials Lab (AML) |
| Hi Temperature Furnace (2000 C) | Thermal Technology 1000-4560-FP20 | Materials characterization | Sample preparation, alloying of materials | Advanced Materials Lab (AML) |
| Automated Micro Indentation Hardness Tester | LECO LM247AT | Materials characterization | Sample preparation | Advanced Materials Lab (AML) |
| Non-Rad Glovebox | Custom | Materials characterization | Sample preparation of rad material | Advanced Materials Lab (AML) |
| Rad Glovebox | Custom | Materials characterization | Sample preparation | Advanced Materials Lab (AML) |
| Linear Sectioning Machine, Non-Rad | Leco MSX-205MZ | Materials characterization | Sample prep | Advanced Materials Lab |
| Polisher / Grinder, Rad | Beuhler Minimet 1000 | Materials characterization | Sample preparation | Advanced Materials Lab |
| Polisher, Non-Rad | LECO Model: GPX-200 | Materials characterization | Sample preparation | Advanced Materials Lab |
| Powder Press, 25 Ton | Carver AutoPellet Press (2) Inside Glovebox | Materials characterization | Sample preparation | Advanced Materials Lab |
| Grinder/Polisher , Non-Rad | LECO SS-1000 Spectrum | Materials characterization | Sample preparation | Advanced Materials Lab |
| Grinder/Polisher , Non-Rad | LECO SS-1000 Spectrum | Materials characterization | Sample preparation | Advanced Materials Lab |
| Hand Grinder | LECO DS-20 | Materials characterization | Sample preparation | Advanced Materials Lab |
| Instron Shear Punch or Tensile Test | Mechanical Testing | Mechanical Properties | Advanced Materials Lab | |
| Saw, Rad | Buehler Isomet Low Speed Saw | Materials characterization | Sample preparation | Advanced Materials Lab |
| Mechanical Test Frame | Instron | Mechanical Testing | Mechanical Properties | Advanced Materials Lab |
| Vacuum Tube Furnace | CM Model 1730-12 HT | Materials characterization | Sample preparation | Advanced Materials Lab |
| Precision Etching and Coating System (PECS) | Gatan model 682 | Materials characterization | Sample preparation | Advanced Materials Lab |
| Nano Indenter Atomic Force Microscope (AFM) | Hysitron TI-950 TriboIndenter | Materials characterization | Sample preparation | Advanced Materials Lab |
| Micro / Macro Hardness Testing | LECO AMH-Series | Materials characterization | Sample preparation | Advanced Materials Lab |
| Retsch Mill | Materials characterization | Sample preparation | Advanced Materials Lab | |
| Sample Mounting Press | LECO DS-20 | Materials characterization | Sample preparation | Advanced Materials Lab |
| Scanning Electron Microscope | JEOL 6610LV with EDS, EBSD, & CL | Materials characterization | Sample preparation | Advanced Materials Lab |
| Transmission Electron Microscope (TEM) | FEI Technai TF30-FEG STwin with EDS and EELS (GIF) | Materials characterization | Sample preparation | Advanced Materials Lab |
| Materials characterization | Sample preparation | Advanced Materials Lab | ||
| Vibratory Polisher | Buehler VibroMet 2 | Materials characterization | Sample preparation | Advanced Materials Lab |