Skip to main content

Two General Device Probe Station

These probe stations are used for materials and device electrical testing and evaluation.

General-device-probe-station
General-device-probe-station

The general device probe stations contain the following test equipment:

  • Two Micromanipulator 200mm manual probe stations with integrated light sources and interchangeable measurement chucks, including isolated and thermal chucks on Micro-G air isolation tables.
  • Agilent B1500 Semiconductor parameter analyzer including:
  • Agilent 1520 Multi-frequency CMU for basic LCR measurements to 2MHz. Includes calibration software and standards
  • 4 Agilent B1511A integrated medium power source measurement units
  • Agilent N1301A integrated CMU unify unit designed to couple both DC and AC measurements into a single measurement system
  • An Agilent integrated B1530 two channel WGFU high resolution arbitrary waveform generator capable of user designed 25nS arbitrary waveforms
  • 2 Agilent B1531A RSU units designed to couple high frequency WGFMU pulse with DC measurement capability. This allows direct transient measurements of pulse response.
  • 4 Micromanipulator probes at each station.
  • MC programmable hot chuck controller for room temperature to 200 °C control.
  • Agilent 8114A 100V, 2A programmable pulse generator for application of discrete pulses or programming sequences.
  • Agilent 33250A 80 MHz Arbitrary waveform generator.
  • HP 4145 Semiconductor Parameter Analyzer with 4 medium power SMU’s, 2 VMU’s and 2 VSU’s for full semiconductor device characterization.
  • Infinium 500MHz, 4 channel oscilloscope with probes.
  • Lecroy 2 channel 1.5GHz oscilloscope with matching sets of AP020 active probes.
  • NI-PXI-1033 40MHz instrumentation bus controller to control all automated tests.
  • PXI-7853R programmable I/O FPGA DAQ system with reconfigurable breakout boxes which allows on the fly control of all I/O testing.
  • PXI-2532 512 cross point programmable switch matrix with reconfigurable breakout boxes.
  • Lecroy LC574AR 4 channel 1.5GHz oscilloscope with all associated test fixtures and probes.
  • Agilent 33120A 15MHz Arbitrary Waveform generator.
  • 2 Agilent E3632A 0 to 25V programmable power supplies.
  • 1 Agilent 34401 programmable multimeter.