The n&k Technologies, Inc. 1280 tool is a table top high resolution spectrometer system capable of analyzing the reflectance and transmittance spectra of a wide variety of thin films. It can determine the optical constants n and k as well as film thickness, from 2 Å up to several µm. It scans from 190 to 1000 nm in under 1 minute, and collects n and k values over the entire range of wavelengths.
It is one of the few optical tools with enough sensitivity and a broad enough wavelength range to reliably provide metrology data for germanium selenide thin films, as an alternative to scanning electron microscope cross-sectioned images.
It can also provide thickness and optical constants data for standard semiconductor films and thin metals, as well as optical band gap. It is capable of providing correlations with stoichiometry of a variety of films such as silicon nitride and germanium selenide. Our lab utilizes it for materials characterization and for thin film metrology.