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X-Ray Facility Equipment

Equipment

Bruker AXS D8 Discover X-Ray Diffractometer

  • For high-resolution determination of crystallographic structure, phase composition, and texture at ambient and high temperatures, this instrument includes:Bruker
  • Nickel filter
  • Göbel Mirror and Germanium primary monochromator
  • Non-ambient temperature stages (-180°C to 1600°C)
  • NaI(Tl) scintillation detector
  • Hi-Star area detector

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Rigaku Miniflex 600 bench-top X-ray diffractometer

  • Miniflex600W generator
  • One dimensional D/teX Ultra high-speed detector (very quick scans)
  • Scintillating point detector with graphite monochromator (best for resolution)
  • Multiple-sample loading capability
  • Zero-loss holders

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Bruker Tracer III SD hand-held XRF

  • Peltier-cooled 10 mm2 SDDXRF_Tracer
  • Typical resolution: 145 eV at 100,000 cps
  • Vacuum pump attachment for enhanced light-element sensitivity
  • Gas-flow chamber for the measurement of gases down to Ne

View current instrument status for Tracer III SD.