The X-Ray and Electron Microscopy Lab (XEML) hosts significant materials characterization capacity, with capabilities including TEM, SEM, XRD, optical microscopy and XRF. The lab also has sample preparation capabilities for optical and electron microscopy.
Location: Micron Engineering Center (MEC) 113
Contact: karthikchinnathambi@boisestate.edu or coreyefaw@boisestate.edu